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The YATE Fail-Safe Interface: The User?s Point of View
Isle of Bendor, France July 10-July 12
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MTDT.2002.1029761The 2002 IEEE International Workshop ...
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D. BIED-CHARRETON, D. GUILLON, B. JACQUES, "The YATE Fail-Safe Interface: The User?s Point of View," Memory Technology, Design and Testin, IEEE International Workshop on, pp. 39, The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002), 2002.
 
 
BibTex
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@article{ 10.1109/MTDT.2002.1029761,
author = {D. BIED-CHARRETON and D. GUILLON and B. JACQUES},
title = {The YATE Fail-Safe Interface: The User?s Point of View},
journal ={Memory Technology, Design and Testin, IEEE International Workshop on},
volume = {0},
year = {2002},
issn = {1087-4852},
pages = {39},
doi = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2002.1029761},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Memory Technology, Design and Testin, IEEE International Workshop on
TI - The YATE Fail-Safe Interface: The User?s Point of View
SN - 1087-4852
SP
EP
A1 - D. BIED-CHARRETON,
A1 - D. GUILLON,
A1 - B. JACQUES,
PY - 2002
KW - null
VL - 0
JA - Memory Technology, Design and Testin, IEEE International Workshop on
ER -
 
D. GUILLON, TECHNICATOME
B. JACQUES, CSEE Transport
This paper deals with some aspects of the use of self-checking integrated circuits in an application that manages the major risks involved in a transport system. It aims to provide an objective account of the advantages and disadvantages of this type of technology. Attention has been focused on the demands made by such integrated circuits on their environment, in particular the CPUs which control them. Nevertheless, much work still needs to be done to bring the design and testing of integrated circuits more in line with the needs of rail safety applications.
Citation:
D. BIED-CHARRETON, D. GUILLON, B. JACQUES, "The YATE Fail-Safe Interface: The User?s Point of View," mtdt, pp.39, The 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002), 2002
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