Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer

Papeete, Tahiti, French Polynesia March 03-March 05

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http://doi.ieeecomputersociety.org/10.1109/PRDC.2004.1276551

10th Pacific Rim International Sympos ...

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	ASCII Text	x
	E. Ciocca, I. Koren, Z. Koren, C. M. Krishna, D. S. Katz, "Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer," Pacific Rim International Symposium on Dependable Computing, IEEE, pp. 43-48, 10th Pacific Rim International Symposium on Dependable Computing (PRDC'04), 2004.

	BibTex	x
	@article{ 10.1109/PRDC.2004.1276551, author = {E. Ciocca and I. Koren and Z. Koren and C. M. Krishna and D. S. Katz}, title = {Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer}, journal ={Pacific Rim International Symposium on Dependable Computing, IEEE}, volume = {0}, year = {2004}, isbn = {0-7695-2076-6}, pages = {43-48}, doi = {http://doi.ieeecomputersociety.org/10.1109/PRDC.2004.1276551}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Pacific Rim International Symposium on Dependable Computing, IEEE TI - Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer SN - 0-7695-2076-6 SP43 EP48 A1 - E. Ciocca, A1 - I. Koren, A1 - Z. Koren, A1 - C. M. Krishna, A1 - D. S. Katz, PY - 2004 KW - null VL - 0 JA - Pacific Rim International Symposium on Dependable Computing, IEEE ER -

E. Ciocca, University of Massachusetts at Amherst

I. Koren, University of Massachusetts at Amherst

Z. Koren, University of Massachusetts at Amherst

C. M. Krishna, University of Massachusetts at Amherst

D. S. Katz, Jet Propulsion Laboratory

Systems that operate in extremely volatile environments, such as orbiting satellites, must be designed with a strong emphasis on fault tolerance. Rather than rely solely on the system hardware, it may be bene.cial to entrust some of the fault handling to software at the application level, which can utilize semantic information and software communication channels to achieve fault tolerance with considerably less power and performance overhead. This paper details the implementation and evaluation of such a software-level approach, Application-Level Fault Tolerance and Detection (ALFTD) into the Orbital Thermal Imaging Spectrometer (OTIS).

Citation:

E. Ciocca, I. Koren, Z. Koren, C. M. Krishna, D. S. Katz, "Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer," prdc, pp.43-48, 10th Pacific Rim International Symposium on Dependable Computing (PRDC'04), 2004

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