"Empirical Validation of Class Diagram Complexity Metrics,"
Chilean Computer Science Society, International Conference of the, pp. 0095, XXI International Conference of the Chilean Computer Science Society (SCCC'01), 2001.
BibTex
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@article{
10.1109/SCCC.2001.10008, author = {}, title = {Empirical Validation of Class Diagram Complexity Metrics}, journal ={Chilean Computer Science Society, International Conference of the}, volume = {0}, year = {2001}, isbn = {0-7695-1396-4}, pages = {0095}, doi = {http://doi.ieeecomputersociety.org/10.1109/SCCC.2001.10008}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Chilean Computer Science Society, International Conference of the TI - Empirical Validation of Class Diagram Complexity Metrics SN - 0-7695-1396-4 SP EP PY - 2001 VL - 0 JA - Chilean Computer Science Society, International Conference of the ER -
Citation:
"Empirical Validation of Class Diagram Complexity Metrics," sccc, pp.0095, XXI International Conference of the Chilean Computer Science Society (SCCC'01), 2001
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