loading...
Architecting Specifications for Test Case Generation
Brisbane, Australia September 22-September 27
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SEFM.2003.1236204First International Conference on Sof ...
 This Article 
 
Buy PURCHASE ARTICLE: $19
PDF
HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
Richard Sinnott, "Architecting Specifications for Test Case Generation," Software Engineering and Formal Methods, International Conference on, pp. 24, First International Conference on Software Engineering and Formal Methods (SEFM'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/SEFM.2003.1236204,
author = {Richard Sinnott},
title = {Architecting Specifications for Test Case Generation},
journal ={Software Engineering and Formal Methods, International Conference on},
volume = {0},
year = {2003},
isbn = {0-7695-1949-0},
pages = {24},
doi = {http://doi.ieeecomputersociety.org/10.1109/SEFM.2003.1236204},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Software Engineering and Formal Methods, International Conference on
TI - Architecting Specifications for Test Case Generation
SN - 0-7695-1949-0
SP
EP
A1 - Richard Sinnott,
PY - 2003
KW - SDL
KW - TTCN
KW - Test Case Generation
VL - 0
JA - Software Engineering and Formal Methods, International Conference on
ER -
 
Richard Sinnott, University of Glasgow
The Specification and Description Language (SDL) together with its associated tool sets can be used for the generation of Tree and Tabular Combined Notation (TTCN) test cases. Surprisingly, little documentation exists on the optimal way to specify systems so that they can best be used for the generation of tests. This paper, elaborates on the different tool supported approaches that can be taken for test case generation and highlights their advantages and disadvantages. A rule based SDL specification style is then presented that facilitates the automatic generation of tests.
Index Terms:
SDL, TTCN, Test Case Generation
Citation:
Richard Sinnott, "Architecting Specifications for Test Case Generation," sefm, pp.24, First International Conference on Software Engineering and Formal Methods (SEFM'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.