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Modeling and Simulation of a Fault Tolerant ATM Switching Architecture
Washington, D.C. April 16-April 22
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/SIMSYM.2000.84489933rd Annual Simulation Symposium
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Muhammad Anan, Sprint Telecommunications Company
Mohsen Guizani, University of West Florida
Multistage Interconnection Networks (MINs) have been proposed as the switching fabrics for B-ISDN. With the throughput requirement of the packet switches exceeding several gigabits/sec, it becomes important to make them fault tolerant. To provide fault tolerance and improve network performance, a new fault-tolerant, self-routing, and high performance switching architecture for ATM networks based on MINs is proposed. It consists of two closely linked Banyan networks. Links are provided at every stage to allow cells to transfer to and from each plane. The performance and the reliability of the proposed architecture is compared to the other networks. The proposed network has low cell loss rate probabilities than other networks for both fault-free and faulty environment. Routing is kept simple as in basic MINs. Furthermore, the proposed switch architecture is modular in its design making it ideal for VLSI implementation.
Index Terms:
MIN, Fault-Tolerance, ATM, Cell loss probability, Reliability
Citation:
Muhammad Anan, Mohsen Guizani, "Modeling and Simulation of a Fault Tolerant ATM Switching Architecture," ss, pp.42, 33rd Annual Simulation Symposium, 2000
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