This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology is proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution.
Index Terms:
Operational Transconductance Amplitier (OTA), Fault Diagnosis, Cellular Automata
Citation:
Baidya N ath Ray, P.Pal Chaudhuri, P.K. Nandi, "Test Solution For OTA Based Analog Circuits," vlsid, pp.773, ASP-DAC/VLSI Design 2002, 2002