loading...
Cellular Automata Based Test Structures with Logic Folding
Kolkata, India January 03-January 07
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2005.6318th International Conference on VLSI ...
 This Article 
 
PDF
HTML
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Biplab K. Sikdar, Bengal Engineering and Science University
Sukanta Das, Bengal Engineering and Science University
Samir Roy, Kalyani Government Engineering College
Niloy Ganguly, Technical University Dresden
Debesh K. Das, Jadavpur University
This paper presents an efficient test solution for VLSI circuits. The test structure is designed with GF(2^P) CA. The introduction to an innovative scheme of logic folding optimizes the cost of test logic that can not be feasible with the flattened structure of GF(2) CA/LFSR.
Citation:
Biplab K. Sikdar, Sukanta Das, Samir Roy, Niloy Ganguly, Debesh K. Das, "Cellular Automata Based Test Structures with Logic Folding," vlsid, pp.71-74, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05), 2005
Usage of this product signifies your acceptance of the Terms of Use.