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Frequency-based BIST for analog circuit testing
Princeton, New Jersey April 30-May 03
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.51261713th IEEE VLSI Test Symposium (VTS'95)
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S. Khaled, B. Kaminska, B. Courtois, M. Lubaszewski, "Frequency-based BIST for analog circuit testing," VLSI Test Symposium, IEEE, pp. 0054, 13th IEEE VLSI Test Symposium (VTS'95), 1995.
 
 
BibTex
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@article{ 10.1109/VTEST.1995.512617,
author = {S. Khaled and B. Kaminska and B. Courtois and M. Lubaszewski},
title = {Frequency-based BIST for analog circuit testing},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1995},
isbn = {0-8186-7000-2},
pages = {0054},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512617},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Frequency-based BIST for analog circuit testing
SN - 0-8186-7000-2
SP
EP
A1 - S. Khaled,
A1 - B. Kaminska,
A1 - B. Courtois,
A1 - M. Lubaszewski,
PY - 1995
KW - built-in self test; analogue integrated circuits; integrated circuit testing; VLSI; waveform generators; frequency-based BIST; analog circuit testing; VLSI; sine wave generator; sinusoidal input signals; variable frequency input stimulus; frequency input signal; T-BIST approach; frequency-counter BIST approach
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
S. Khaled, Ecole Polytech., Montreal, Que., Canada
B. Kaminska, Ecole Polytech., Montreal, Que., Canada
B. Courtois, Ecole Polytech., Montreal, Que., Canada
M. Lubaszewski, Ecole Polytech., Montreal, Que., Canada
Abstract: In this paper we propose a configuration for a VLSI analog sine wave generator with an appropriate frequency BIST. The generator is used for testing circuits that require sinusoidal input signals with a variable frequency as an input stimulus. The detectors indicate any deviation of the frequency input signal from the nominal value /spl plusmn//spl epsiv/. A sine wave generator and two different BISTs are proposed: the defection and translation (DandT) T-BIST approach and the frequency-counter BIST approach. Some experimental results are also presented.
Index Terms:
built-in self test; analogue integrated circuits; integrated circuit testing; VLSI; waveform generators; frequency-based BIST; analog circuit testing; VLSI; sine wave generator; sinusoidal input signals; variable frequency input stimulus; frequency input signal; T-BIST approach; frequency-counter BIST approach
Citation:
S. Khaled, B. Kaminska, B. Courtois, M. Lubaszewski, "Frequency-based BIST for analog circuit testing," vts, pp.0054, 13th IEEE VLSI Test Symposium (VTS'95), 1995
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