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Detection and location of faults and defects using digital signal processing
Princeton, New Jersey April 30-May 03
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.51264713th IEEE VLSI Test Symposium (VTS'95)
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C. Thibeault, "Detection and location of faults and defects using digital signal processing," VLSI Test Symposium, IEEE, pp. 0262, 13th IEEE VLSI Test Symposium (VTS'95), 1995.
 
 
BibTex
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@article{ 10.1109/VTEST.1995.512647,
author = {C. Thibeault},
title = {Detection and location of faults and defects using digital signal processing},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1995},
isbn = {0-8186-7000-2},
pages = {0262},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1995.512647},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Detection and location of faults and defects using digital signal processing
SN - 0-8186-7000-2
SP
EP
A1 - C. Thibeault,
PY - 1995
KW - integrated circuit testing; fault location; digital integrated circuits; signal processing; fault diagnosis; logic testing; fault detection; fault location; defects; digital signal processing; test method; sampled current; sampled voltage; quiescent current; parasitic resistive contacts; diagnosis; DSP technique
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
C. Thibeault, Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
Abstract: This paper presents the bases of a test method that can detect and locate faults and defects. This method is based on the use of digital signal processing applied on sampled current or voltage and can be applied to technologies with significant quiescent current. A simple procedure is also proposed in order to locate parasitic resistive contacts, and diagnosis potential of the method is explored.
Index Terms:
integrated circuit testing; fault location; digital integrated circuits; signal processing; fault diagnosis; logic testing; fault detection; fault location; defects; digital signal processing; test method; sampled current; sampled voltage; quiescent current; parasitic resistive contacts; diagnosis; DSP technique
Citation:
C. Thibeault, "Detection and location of faults and defects using digital signal processing," vts, pp.0262, 13th IEEE VLSI Test Symposium (VTS'95), 1995
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