| 13th IEEE VLSI Test Symposium (VTS'95) |
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ISBN:
0-8186-7000-2 |
| Princeton, New Jersey April 30-May 03 |
pp. xii
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 | Session 1: Advanced Test Pattern Generation Methods |
D.E. Long, AT&T Bell Labs., Murray Hill, NJ, USA
M.A. Iyer, AT&T Bell Labs., Murray Hill, NJ, USA
pp. 0004
M.C. Hansen, Advanced Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA
J.P. Hayes, Advanced Comput. Archit. Lab., Michigan Univ., Ann Arbor, MI, USA
pp. 0020
F. Corno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
P. Prinetto, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M. Rebaudengo, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M.S. Reorda, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
E. Veiluva, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
pp. 0029
D. Gizopoulos, Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
D. Nikolos, Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
A. Paschalis, Inst. of Informatics & Telecommun., NCSR Demokritos, Attiki, Greece
pp. 0035
| Session 2: Mixed-Signal Circuit Test |
A. Balivada, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Y. Hoskote, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
J.A. Abraham, Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
pp. 0042
D. Vazquez, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
A. Rueda, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
J.L. Huertas, Dpto. de Diseno Analogico, Univ. de Sevilla, Spain
pp. 0048
S. Khaled, Ecole Polytech., Montreal, Que., Canada
pp. 0054
S. Sunter, Telecom Microelectron. Centre, Northern Telecom Electron. Ltd., Nepean, Ont., Canada
pp. 0060
L. Sebaa, Western Digital Corp., Irvine, CA, USA
N. Gardner, Western Digital Corp., Irvine, CA, USA
R. Valley, Western Digital Corp., Irvine, CA, USA
pp. 0066
| Session 3: Defect Coverage and Test Quality |
J. Najm, State Univ. of New York, Buffalo, NY, USA
J. Patel, State Univ. of New York, Buffalo, NY, USA
pp. 0089
J.A. Segura, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
M. Roca, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
D. Mateo, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
A. Rubio, Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
pp. 0095
J. Arguelles, Dept. de Electron., Cantabria Univ., Santander, Spain
M.J. Lopez, Dept. de Electron., Cantabria Univ., Santander, Spain
J. Blanco, Dept. de Electron., Cantabria Univ., Santander, Spain
M. Martinez, Dept. de Electron., Cantabria Univ., Santander, Spain
S. Bracho, Dept. de Electron., Cantabria Univ., Santander, Spain
pp. 0101
| Session 4: Advanced BIST Approaches |
J. Savir, IBM Corp., Hopewell Junction, NY, USA
pp. 0108
A.P. Stroele, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany
pp. 0118
S.K. Mukund, Center for Reliable Comput., Stanford Univ., CA, USA
T.R.N. Rao, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 0125
N. Mukherjee, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
H. Kassab, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Rajski, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Tyszer, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
pp. 0132
J.A. Floyd, Semicond Product Center, Motorola Inc., Austin, TX, USA
M. Perry, Semicond Product Center, Motorola Inc., Austin, TX, USA
pp. 0140
| Session 5: Synthesis for Testability |
F.F. Hsu, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
J.H. Patel, Center for Reliable & High Performance Comput., Illinois Univ., Urbana, IL, USA
pp. 0158
Ting-Yu Kuo, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Chun-Yeh Liu, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
K.K. Saluja, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
pp. 0164
K. Vahidi, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
A. Orailoglu, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
pp. 0170
Xinli Gu, Dept. of Comput. & Inf. Sci., Linkoping Univ., Sweden
pp. 0176
| Session 6: Fault Modeling |
M. Renovell, Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
P. Huc, Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
Y. Bertrand, Lab. d'Informatique, Robotique et Microelectronique, Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 0184
Ding Lu, Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
C.Q. Tong, Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
pp. 0190
S.R. Makar, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 0196
V.H. Champac, Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico
J. Figueras, Inst. Nacional de Astrofisica, Opt. y Electron., Puebla, Mexico
pp. 0202
P. Liden, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
P. Dahlgren, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 0208
| Session 7: Fault Simulation I |
R. Nair, Synopsys Inc., Mountain View, CA, USA
pp. 0221
M. Riedel, MACS Lab., McGill Univ., Montreal, Que., Canada
J. Rajski, MACS Lab., McGill Univ., Montreal, Que., Canada
pp. 0227
| Session 8: Fault Diagnosis |
C.E. Stroud, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
T.R. Damarla, Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
pp. 0244
T. Liu, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
F. Lombardi, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
J. Salinas, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 0256
C. Thibeault, Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
pp. 0262
| Session 9: Design for Testability |
M.A. Breuer, Sun Microsyst. Inc., Mountain View, CA, USA
pp. 0270
Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 0277
A. Khoche, Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
E. Brunvand, Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
pp. 0283
M. Soufi, Ecole Polytech. de Montreal, Que., Canada
Y. Savaria, Ecole Polytech. de Montreal, Que., Canada
pp. 0290
O.A. Petlin, Dept. of Comput. Sci., Manchester Univ., UK
S.B. Furber, Dept. of Comput. Sci., Manchester Univ., UK
pp. 0296
| Session 10: Iddq Testing |
M. Dalpasso, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Favalli, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
P. Olivo, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
pp. 0304
R.S. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S. Kajihara, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 0310
U. Mahlstedt, Inst. fur Theor. Elektrotech., Hannover Univ., Germany
J. Alt, Inst. fur Theor. Elektrotech., Hannover Univ., Germany
M. Heinitz, Inst. fur Theor. Elektrotech., Hannover Univ., Germany
pp. 0317
J. Rius, Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
J. Figueras, Dept. d'Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 0324
| Session 11: Automatic Test Pattern Generation |
F. Corno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
P. Prinetto, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
M. Sonza Reorda, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
U. Glaser, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
H.T. Vierhaus, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
pp. 0338
T. Inoue, Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
H. Maeda, Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
H. Fujiwara, Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Japan
pp. 0344
B. Vinnakota, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
N.J. Stessman, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
pp. 0367
| Session 12: Delay Fault Testing |
A. Krstic, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 0374
P. Girard, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
C. Landrault, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
S. Pravossoudovitch, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
B. Rodriguez, Lab. d'Inf. de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
pp. 0380
H. Hengster, Dept. of Comput. Sci., Frankfurt Univ., Germany
R. Drechsler, Dept. of Comput. Sci., Frankfurt Univ., Germany
B. Becker, Dept. of Comput. Sci., Frankfurt Univ., Germany
pp. 0387
I.P. Shaik, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
M.L. Bushnell, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 0393
W. Ke, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
P.R. Menon, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
pp. 0400
| Session 13: Test Pattern Generation for BIST |
N.A. Touba, Dept. of Electr. Eng., Stanford Univ., CA, USA
pp. 0410
M. Chatterjee, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
D.K. Pradhan, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
pp. 0417
N. Zacharia, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Rajski, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
J. Tyszer, Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
pp. 0426
S. Lejmi, Ecole Polytech. de Montreal, Que., Canada
B. Ayari, Ecole Polytech. de Montreal, Que., Canada
pp. 0434
G. Kemnitz, Inst. fur Tech. Inf., Tech. Univ. Dresden, Germany
pp. 0440
| Session 14: Self-Checking Systems I |
S.K. Shoukourian, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
A.G. Kostanian, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
V.A. Margarian, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
A.A. Ashour, Dept. of Comput. Sci. & Numerical Math., Yerevan State Univ., Armenia
pp. 0448
A. Bogliolo, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
M. Damiani, Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
pp. 0454
W.W. Weber, Dept. of Electr. Eng., Auburn Univ., AL, USA
A.D. Singh, Dept. of Electr. Eng., Auburn Univ., AL, USA
pp. 0472
| Best Paper - 1994 |
J. Carletta, Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
C. Papachristou, Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
pp. 0486
pp. 0492
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