Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits

Monterey, California April 27-May 01

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600284

15th IEEE VLSI Test Symposium (VTS'97)

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Christian Dufaza Articles by Hassan Ihs

	ASCII Text	x
	Christian Dufaza, Hassan Ihs, "Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits," VLSI Test Symposium, IEEE, pp. 252, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTEST.1997.600284, author = {Christian Dufaza and Hassan Ihs}, title = {Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {252}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600284}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits SN - 0-8186-7810-0 SP EP A1 - Christian Dufaza, A1 - Hassan Ihs, PY - 1997 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Christian Dufaza, Laboratoire d'Informatique de Robotique

Hassan Ihs, Laboratoire d'Informatique de Robotique

This paper presents a DFT/BIST technique for switched-capacitor (SC) circuits that consists of measuring all capacitance ratios of transfer functions in the DC domain. Then, the specifications of a SC circuit are computed from these measured capacitance ratios and compared to the fault-free ones. Moreover, a maximal fault diagnosis is realized for the capacitances. This test technique uses re-configur

Citation:

Christian Dufaza, Hassan Ihs, "Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits," vts, pp.252, 15th IEEE VLSI Test Symposium (VTS'97), 1997

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.