On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms

Monterey, California April 27-May 01

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http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600327

15th IEEE VLSI Test Symposium (VTS'97)

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	Can Oekmen, Martin Keim, Rolf Krieger, Bernd Becker, "On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms," VLSI Test Symposium, IEEE, pp. 426, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTEST.1997.600327, author = {Can Oekmen and Martin Keim and Rolf Krieger and Bernd Becker}, title = {On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {426}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1997.600327}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms SN - 0-8186-7810-0 SP EP A1 - Can Oekmen, A1 - Martin Keim, A1 - Rolf Krieger, A1 - Bernd Becker, PY - 1997 KW - Build in self test (BIST) KW - genetic algorithm KW - input probability KW - weighted random pattern generation (WRPG) VL - 0 JA - VLSI Test Symposium, IEEE ER -

Can Oekmen, Institute of Computer Science Albert-Ludwigs-University

Martin Keim, Institute of Computer Science Albert-Ludwigs-University

Rolf Krieger, Institute of Computer Science Albert-Ludwigs-University

Bernd Becker, Institute of Computer Science Albert-Ludwigs-University

We introduce a two-staged Genetic Algorithm for optimizing weighted random pattern testing in a Built-In-Self-Test (BIST) environment. The first stage includes the OBDD-based optimization of input probabilities with regard to the expected test length. The optimization itself is constrained to discrete weight values which can directly be integrated in a BIST environment. During the second stage, the hardware-design of the actual BIST-structure is optimized. Experimental results are given to demonstrate the quality of our approach.

Index Terms:

Build in self test (BIST), genetic algorithm, input probability, weighted random pattern generation (WRPG)

Citation:

Can Oekmen, Martin Keim, Rolf Krieger, Bernd Becker, "On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms," vts, pp.426, 15th IEEE VLSI Test Symposium (VTS'97), 1997

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