K.T. Lee, C. Nordquist, J.A. Abraham,
"2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits,"
VLSI Test Symposium, IEEE, pp. 34, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670846, author = {K.T. Lee and C. Nordquist and J.A. Abraham}, title = {2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {34}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670846}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - 2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits SN - 1093-0167 SP EP A1 - K.T. Lee, A1 - C. Nordquist, A1 - J.A. Abraham, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
K.T. Lee, C. Nordquist, J.A. Abraham, "2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits," vts, pp.34, 16th IEEE VLSI Test Symposium, 1998
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