J. Zhao, F.J. Meyer, F. Lombardi,
"3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories,"
VLSI Test Symposium, IEEE, pp. 42, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670847, author = {J. Zhao and F.J. Meyer and F. Lombardi}, title = {3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {42}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670847}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - 3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories SN - 1093-0167 SP EP A1 - J. Zhao, A1 - F.J. Meyer, A1 - F. Lombardi, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
J. Zhao, F.J. Meyer, F. Lombardi, "3.1 Fault Detection and Diagnosis of Interconnects of Random Access Memories," vts, pp.42, 16th IEEE VLSI Test Symposium, 1998
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