P. Bose,
"3.3 Performance Test Case Generation for Microprocessors,"
VLSI Test Symposium, IEEE, pp. 54, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670849, author = {P. Bose}, title = {3.3 Performance Test Case Generation for Microprocessors}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {54}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670849}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - 3.3 Performance Test Case Generation for Microprocessors SN - 1093-0167 SP EP A1 - P. Bose, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
PURCHASE ARTICLE: $19
IEEE Xplore Subscribers
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb