J.T.-Y. Chang, C.-W. Tseng, Y.-C. Chu, S. Wattal, M. Purtell, E.J. McCluskey,
"6.3 Experimental Results for IDDQ and VLV Testing,"
VLSI Test Symposium, IEEE, pp. 118, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670858, author = {J.T.-Y. Chang and C.-W. Tseng and Y.-C. Chu and S. Wattal and M. Purtell and E.J. McCluskey}, title = {6.3 Experimental Results for IDDQ and VLV Testing}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {118}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670858}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - 6.3 Experimental Results for IDDQ and VLV Testing SN - 1093-0167 SP EP A1 - J.T.-Y. Chang, A1 - C.-W. Tseng, A1 - Y.-C. Chu, A1 - S. Wattal, A1 - M. Purtell, A1 - E.J. McCluskey, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
PURCHASE ARTICLE: $19
IEEE Xplore Subscribers
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb