M.K. Iyer, M.L. Bushnell,
"7.3 Effect of Noise on Analog Circuit Testing,"
VLSI Test Symposium, IEEE, pp. 138, 16th IEEE VLSI Test Symposium, 1998.
BibTex
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@article{
10.1109/VTEST.1998.670861, author = {M.K. Iyer and M.L. Bushnell}, title = {7.3 Effect of Noise on Analog Circuit Testing}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {138}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670861}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - 7.3 Effect of Noise on Analog Circuit Testing SN - 1093-0167 SP EP A1 - M.K. Iyer, A1 - M.L. Bushnell, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
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