M. Psarakis, D. Gizopoulos, A. Paschalis, Y. Zorian,
"8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model,"
VLSI Test Symposium, IEEE, pp. 152, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670863, author = {M. Psarakis and D. Gizopoulos and A. Paschalis and Y. Zorian}, title = {8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {152}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670863}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - 8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model SN - 1093-0167 SP EP A1 - M. Psarakis, A1 - D. Gizopoulos, A1 - A. Paschalis, A1 - Y. Zorian, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
M. Psarakis, D. Gizopoulos, A. Paschalis, Y. Zorian, "8.1 Robustly Testable Array Multipliers under Realistic Sequential Cell Fault Model," vts, pp.152, 16th IEEE VLSI Test Symposium, 1998
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