X. Lin, I. Pomeranz, S.M. Reddy,
"8.3 On Removing Redundant Faults in Synchronous Sequential Circuits,"
VLSI Test Symposium, IEEE, pp. 168, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670865, author = {X. Lin and I. Pomeranz and S.M. Reddy}, title = {8.3 On Removing Redundant Faults in Synchronous Sequential Circuits}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {168}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670865}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - 8.3 On Removing Redundant Faults in Synchronous Sequential Circuits SN - 1093-0167 SP EP A1 - X. Lin, A1 - I. Pomeranz, A1 - S.M. Reddy, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
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