I.T. Sylla, M. Slamani, B. Kaminska, F.M. Hossein, P. Vincent,
"11.2 Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing,"
VLSI Test Symposium, IEEE, pp. 239, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTEST.1998.670875, author = {I.T. Sylla and M. Slamani and B. Kaminska and F.M. Hossein and P. Vincent}, title = {11.2 Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {239}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670875}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - 11.2 Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing SN - 1093-0167 SP EP A1 - I.T. Sylla, A1 - M. Slamani, A1 - B. Kaminska, A1 - F.M. Hossein, A1 - P. Vincent, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
I.T. Sylla, M. Slamani, B. Kaminska, F.M. Hossein, P. Vincent, "11.2 Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing," vts, pp.239, 16th IEEE VLSI Test Symposium, 1998
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