Co-Coordinator: Keerthi Heragu, Texas Instruments,
"Where We Might Stumble with Embedded-System Test,"
VLSI Test Symposium, IEEE, pp. 470, 16th IEEE VLSI Test Symposium, 1998.
BibTex
x
@article{
10.1109/VTS.1998.10010, author = {Co-Coordinator: Keerthi Heragu and Texas Instruments}, title = {Where We Might Stumble with Embedded-System Test}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {470}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1998.10010}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - Where We Might Stumble with Embedded-System Test SN - 1093-0167 SP EP A1 - Co-Coordinator: Keerthi Heragu, A1 - Texas Instruments, PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -
PURCHASE ARTICLE: $19
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb