loading...
A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits
San Diego, California April 26-April 30
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.1999.7666801999 17TH IEEE VLSI Test Symposium
 This Article 
 
Buy PURCHASE ARTICLE: $19
PDF
HTML
Buy IEEE Xplore Subscribers
 
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
ASCII Text
x 
 
I. Rayane, J. Velasco-Medina, M. Nicolaidis, "A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits," VLSI Test Symposium, IEEE, pp. 304, 1999 17TH IEEE VLSI Test Symposium, 1999.
 
 
BibTex
x
 
@article{ 10.1109/VTEST.1999.766680,
author = {I. Rayane and J. Velasco-Medina and M. Nicolaidis},
title = {A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1999},
issn = {1093-0167},
pages = {304},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.1999.766680},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits
SN - 1093-0167
SP
EP
A1 - I. Rayane,
A1 - J. Velasco-Medina,
A1 - M. Nicolaidis,
PY - 1999
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
I. Rayane, TIMA / INPG
J. Velasco-Medina, TIMA / INPG
M. Nicolaidis, TIMA / INPG
A new digital BIST structure is proposed in this paper. During test mode, the Op Amp under test is placed in a voltage follower configuration in order to detect its slew-rate deviation, or in a comparator configuration in order to detect its signal propagation delay deviation. The test stimuli and the BIST control signals are simply derived from the test control signal TST using delay elements and logical gates. The test response is analyzed by using a pure digital circuitry. Simulation results show the effectiveness of the proposed technique with a low area overhead.
Citation:
I. Rayane, J. Velasco-Medina, M. Nicolaidis, "A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits," vts, pp.304, 1999 17TH IEEE VLSI Test Symposium, 1999
Usage of this product signifies your acceptance of the Terms of Use.