Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method

Montreal, Canada April 30-May 04

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http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843870

18th IEEE VLSI Test Symposium (VTS'00)

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	Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi[4], "Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method," VLSI Test Symposium, IEEE, pp. 395, 18th IEEE VLSI Test Symposium (VTS'00), 2000.

	BibTex	x
	@article{ 10.1109/VTEST.2000.843870, author = {Takahiro J. Yamaguchi and Masahiro Ishida and Mani Soma and Toshifumi Watanabe and Tadahiro Ohmi[4]}, title = {Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2000}, issn = {1093-0167}, pages = {395}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843870}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method SN - 1093-0167 SP EP A1 - Takahiro J. Yamaguchi, A1 - Masahiro Ishida, A1 - Mani Soma, A1 - Toshifumi Watanabe, A1 - Tadahiro Ohmi[4], PY - 2000 KW - peak-to-peak jitter KW - RMS jitter KW - sinusoidal jitter KW - analytic signal VL - 0 JA - VLSI Test Symposium, IEEE ER -

Takahiro J. Yamaguchi, Advantest Laboratories, Ltd.

Masahiro Ishida, Advantest Laboratories, Ltd.

Mani Soma, University of Washington

Toshifumi Watanabe, Advantest Corporation

Tadahiro Ohmi[4], Tohoku Universityapan

This paper proposes a new method based on analytic signal theory for extracting both peak-to-peak and RMS jitter from PLL output signals. The method relies on the extension of a real signal into an analytic signal by using the Hilbert transform. Both the theoretical basis and fundamental concepts of the proposed method are explained. A unified view of the conventional methods is also presented. Matlab simulations of random jitter and experimental data of sinusoidal jitter validate the results of this method.

Index Terms:

peak-to-peak jitter, RMS jitter, sinusoidal jitter, analytic signal

Citation:

Takahiro J. Yamaguchi, Masahiro Ishida, Mani Soma, Toshifumi Watanabe, Tadahiro Ohmi[4], "Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method," vts, pp.395, 18th IEEE VLSI Test Symposium (VTS'00), 2000

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