"Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue,"
VLSI Test Symposium, IEEE, pp. 0153, 19th IEEE VLSI Test Symposium, 2001.
BibTex
x
@article{
10.1109/VTS.2001.10020, author = {}, title = {Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2001}, isbn = {0-7695-1122-8}, pages = {0153}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.10020}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - VLSI Test Symposium, IEEE TI - Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue SN - 0-7695-1122-8 SP EP PY - 2001 VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"Guaranteeing Quality throughout the Product Life Cycle: On-Line Test and Repair to the Rescue," vts, pp.0153, 19th IEEE VLSI Test Symposium, 2001
PDF
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb