"ATPG for Design Errors-Is It Possible?,"
VLSI Test Symposium, IEEE, pp. 0283, 19th IEEE VLSI Test Symposium, 2001.
BibTex
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@article{
10.1109/VTS.2001.10019, author = {}, title = {ATPG for Design Errors-Is It Possible?}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2001}, isbn = {0-7695-1122-8}, pages = {0283}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.10019}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - ATPG for Design Errors-Is It Possible? SN - 0-7695-1122-8 SP EP PY - 2001 VL - 0 JA - VLSI Test Symposium, IEEE ER -
Citation:
"ATPG for Design Errors-Is It Possible?," vts, pp.0283, 19th IEEE VLSI Test Symposium, 2001
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