On Test Data Volume Reduction for Multiple Scan Chain Designs

Monterey, California April 28-May 02

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http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011119

20th IEEE VLSI Test Symposium

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	ASCII Text	x
	Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz, "On Test Data Volume Reduction for Multiple Scan Chain Designs," VLSI Test Symposium, IEEE, pp. 0103, 20th IEEE VLSI Test Symposium, 2002.

	BibTex	x
	@article{ 10.1109/VTS.2002.1011119, author = {Sudhakar M. Reddy and Kohei Miyase and Seiji Kajihara and Irith Pomeranz}, title = {On Test Data Volume Reduction for Multiple Scan Chain Designs}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2002}, isbn = {0-7695-1570-3}, pages = {0103}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011119}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - On Test Data Volume Reduction for Multiple Scan Chain Designs SN - 0-7695-1570-3 SP EP A1 - Sudhakar M. Reddy, A1 - Kohei Miyase, A1 - Seiji Kajihara, A1 - Irith Pomeranz, PY - 2002 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Sudhakar M. Reddy, University of Iowa

Kohei Miyase, Kyushu Institute of Technology

Seiji Kajihara, Kyushu Institute of Technology

Irith Pomeranz, Purdue University

We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming combinational decompressor circuit.

Citation:

Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz, "On Test Data Volume Reduction for Multiple Scan Chain Designs," vts, pp.0103, 20th IEEE VLSI Test Symposium, 2002

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