Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits

Monterey, California April 28-May 02

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http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011136

20th IEEE VLSI Test Symposium

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	M. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs, "Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits," VLSI Test Symposium, IEEE, pp. 0181, 20th IEEE VLSI Test Symposium, 2002.

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	@article{ 10.1109/VTS.2002.1011136, author = {M. Enamul Amyeen and Irith Pomeranz and W. Kent Fuchs}, title = {Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2002}, isbn = {0-7695-1570-3}, pages = {0181}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011136}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

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	TY - CONF JO - VLSI Test Symposium, IEEE TI - Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits SN - 0-7695-1570-3 SP EP A1 - M. Enamul Amyeen, A1 - Irith Pomeranz, A1 - W. Kent Fuchs, PY - 2002 VL - 0 JA - VLSI Test Symposium, IEEE ER -

M. Enamul Amyeen, Purdue University

Irith Pomeranz, Purdue University

W. Kent Fuchs, Purdue University

We introduce theorems that enable efficient identification of indistinguishable fault pairs in synchronous sequential circuits using an iterative logic array of limited length. These theorems can be used for identifying fault pairs that can be dropped from consideration before diagnostic ATPG starts, thus improving the efficiency of diagnostic ATPG.Experimental results are presented to demonstrate the effectiveness of the proposed theorems, which allow us to identify almost all the indistinguishable fault pairs infinite-state machine benchmarks.

Citation:

M. Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs, "Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits," vts, pp.0181, 20th IEEE VLSI Test Symposium, 2002

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