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Diagnosis of Sequence-Dependent Chips
Monterey, California April 28-May 02
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2002.101113720th IEEE VLSI Test Symposium
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James C.-M. Li, E. J. McCluskey, "Diagnosis of Sequence-Dependent Chips," VLSI Test Symposium, IEEE, pp. 0187, 20th IEEE VLSI Test Symposium, 2002.
 
 
BibTex
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@article{ 10.1109/VTS.2002.1011137,
author = {James C.-M. Li and E. J. McCluskey},
title = {Diagnosis of Sequence-Dependent Chips},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {0187},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011137},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Diagnosis of Sequence-Dependent Chips
SN - 0-7695-1570-3
SP
EP
A1 - James C.-M. Li,
A1 - E. J. McCluskey,
PY - 2002
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
James C.-M. Li, Stanford University
E. J. McCluskey, Stanford University
A technique capable of diagnosing single and multiple stuck-open and stuck-at faults is presented. Eleven sequence-dependent chips (test results depend on the order of test patterns) are diagnosed. Seven of them are diagnosed as having single stuck-open faults. Two of them are diagnosed as having multiple stuck-at and stuck-open faults.
Citation:
James C.-M. Li, E. J. McCluskey, "Diagnosis of Sequence-Dependent Chips," vts, pp.0187, 20th IEEE VLSI Test Symposium, 2002
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