This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word couplinmg faults. Then, it establishes the data background sequence (DBS) for each intra-word coupling fault. These DBSs will be compiled into a (1 + 28 \times [log₂B]) \times {n\over B} test with complete fault coverage of the target faults, where n is the size of the memory and B the word size. The test length can be reduced to 29 \times {n\over B} when the intra-word faults are restricted to physical adjacent cells within a word.