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GHz RF Front-end Bandwidth Time Domain Measurement
Napa Valley, California April 25-April 29
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.129924722nd IEEE VLSI Test Symposium
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Qi Wang, Yi Tang, Mani Soma, "GHz RF Front-end Bandwidth Time Domain Measurement," VLSI Test Symposium, IEEE, pp. 223, 22nd IEEE VLSI Test Symposium, 2004.
 
 
BibTex
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@article{ 10.1109/VTEST.2004.1299247,
author = {Qi Wang and Yi Tang and Mani Soma},
title = {GHz RF Front-end Bandwidth Time Domain Measurement},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2004},
issn = {1093-0167},
pages = {223},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299247},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - GHz RF Front-end Bandwidth Time Domain Measurement
SN - 1093-0167
SP
EP
A1 - Qi Wang,
A1 - Yi Tang,
A1 - Mani Soma,
PY - 2004
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Qi Wang, University of Washington, Seattle
Yi Tang, University of Washington, Seattle
Mani Soma, University of Washington, Seattle
This paper proposes a method and an on-chip test circuit to measure the center frequency and the bandwidth of RF front-end circuits using the peak amplitudes and the periods of the output signal in response to a realistic step input signal. The method is also suitable for implementation in external test instrumentation.
Citation:
Qi Wang, Yi Tang, Mani Soma, "GHz RF Front-end Bandwidth Time Domain Measurement," vts, pp.223, 22nd IEEE VLSI Test Symposium, 2004
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