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An Approach to the Built-In Self-Test of Field Programmable Analog Arrays
Napa Valley, California April 25-April 29
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.129926822nd IEEE VLSI Test Symposium
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T. Balen, A. Andrade Jr., F. Aza?, M. Lubaszewski, M. Renovell, "An Approach to the Built-In Self-Test of Field Programmable Analog Arrays," VLSI Test Symposium, IEEE, pp. 383, 22nd IEEE VLSI Test Symposium, 2004.
 
 
BibTex
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@article{ 10.1109/VTEST.2004.1299268,
author = {T. Balen and A. Andrade Jr. and F. Aza? and M. Lubaszewski and M. Renovell},
title = {An Approach to the Built-In Self-Test of Field Programmable Analog Arrays},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2004},
issn = {1093-0167},
pages = {383},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299268},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - An Approach to the Built-In Self-Test of Field Programmable Analog Arrays
SN - 1093-0167
SP
EP
A1 - T. Balen,
A1 - A. Andrade Jr.,
A1 - F. Aza?,
A1 - M. Lubaszewski,
A1 - M. Renovell,
PY - 2004
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
T. Balen, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
A. Andrade Jr., Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
F. Aza?, Universit? de Montpellier II, France
M. Lubaszewski, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil; Universidad de Sevilla, Spain
M. Renovell, Universit? de Montpellier II, France
The use of the Oscillation Test Strategy to test Configurable Analog Blocks of Field Programmable Analog Arrays (FPAAs) has been proposed previously, solving the complex problem of test stimuli generation. An improvement to that technique is presented in this paper, using the resources of the FPAA to build an Output Response Analyzer. This new approach offers a full Built-In Self-Test scheme with no area overhead and requiring a low cost Automatic Test Equipment. Experiments show the efficiency of the approach in detecting parametric faults of the tested components.
Citation:
T. Balen, A. Andrade Jr., F. Aza?, M. Lubaszewski, M. Renovell, "An Approach to the Built-In Self-Test of Field Programmable Analog Arrays," vts, pp.383, 22nd IEEE VLSI Test Symposium, 2004
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