Accelerating Learning from Experience: Avoiding Defects Faster

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/52.965803

November/December 2001 (vol. 18 no. 6) pp. 56-61

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Lutz Prechelt

	ASCII Text	x
	Lutz Prechelt, "Accelerating Learning from Experience: Avoiding Defects Faster," IEEE Software, vol. 18, no. 6, pp. 56-61, November/December, 2001.

	BibTex	x
	@article{ 10.1109/52.965803, author = {Lutz Prechelt}, title = {Accelerating Learning from Experience: Avoiding Defects Faster}, journal ={IEEE Software}, volume = {18}, number = {6}, issn = {0740-7459}, year = {2001}, pages = {56-61}, doi = {http://doi.ieeecomputersociety.org/10.1109/52.965803}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Software TI - Accelerating Learning from Experience: Avoiding Defects Faster IS - 6 SN - 0740-7459 SP56 EP61 EPD - 56-61 A1 - Lutz Prechelt, PY - 2001 VL - 18 JA - IEEE Software ER -

Lutz Prechelt

Defect logging and defect data analysis aim to decrease programmers' repetitive errors. DLDA was inspired by Watts Humphrey's Personal Software Process but has a much lower learning cost. A controlled experiment validated the technique.

Citation:

Lutz Prechelt, "Accelerating Learning from Experience: Avoiding Defects Faster," IEEE Software, vol. 18, no. 6, pp. 56-61, Nov./Dec. 2001, doi:10.1109/52.965803

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.