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Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.124515January/March 1992 (vol. 9 no. 1) pp. 30-39
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Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design and Test of Computers, vol. 9, no. 1, pp. 30-39, January/March, 1992.
 
 
BibTex
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@article{ 10.1109/54.124515,
author = {Mustapha Slamani and Bozena Kaminska},
title = {Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing},
journal ={IEEE Design and Test of Computers},
volume = {9},
number = {1},
issn = {0740-7475},
year = {1992},
pages = {30-39},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.124515},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - MGZN
JO - IEEE Design and Test of Computers
TI - Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing
IS - 1
SN - 0740-7475
SP30
EP39
EPD - 30-39
A1 - Mustapha Slamani,
A1 - Bozena Kaminska,
PY - 1992
VL - 9
JA - IEEE Design and Test of Computers
ER -
 

An approach based on functional testing and on sensitivity calculation of many output parameters for diagnosis of defective elements in analog circuits is presented. A sensitivity matrix that gives the relation between the deviation of output parameters and the deviation of defective components in a circuit forms the basis of the test equations. Diverse types of measurement help improve the diagnostic resolution. Experimental results are presented to clarify the algorithm and prove its efficiency in a practical case.

Citation:
Mustapha Slamani, Bozena Kaminska, "Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing," IEEE Design and Test of Computers, vol. 9, no. 1, pp. 30-39, Jan. 1992, doi:10.1109/54.124515
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