Concurrent Checking of Clock Signal Correctness

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http://doi.ieeecomputersociety.org/10.1109/54.735926

October-December 1998 (vol. 15 no. 4) pp. 42-48

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	ASCII Text	x
	Cecilia Metra, Michele Favalli, Bruno Riccò, "Concurrent Checking of Clock Signal Correctness," IEEE Design and Test of Computers, vol. 15, no. 4, pp. 42-48, October-December, 1998.

	BibTex	x
	@article{ 10.1109/54.735926, author = {Cecilia Metra and Michele Favalli and Bruno Riccò}, title = {Concurrent Checking of Clock Signal Correctness}, journal ={IEEE Design and Test of Computers}, volume = {15}, number = {4}, issn = {0740-7475}, year = {1998}, pages = {42-48}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.735926}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Concurrent Checking of Clock Signal Correctness IS - 4 SN - 0740-7475 SP42 EP48 EPD - 42-48 A1 - Cecilia Metra, A1 - Michele Favalli, A1 - Bruno Riccò, PY - 1998 KW - Concurrent checking KW - clock signals KW - temporary faults KW - self-checking circuits VL - 15 JA - IEEE Design and Test of Computers ER -

Cecilia Metra

Michele Favalli

Bruno Riccò

This paper presents a novel concept for concurrently checking the correctness of signals of clock distribution networks of synchronous systems. A VLSI circuitry is then proposed that, based on such a concept, performs the concurrent checking of such signals with respect to permanent and temporary (i.e., transient and intermittent) faults (permanently or temporary) changing their waveforms with respect to those expected in the fault-free case. Such a circuitry is in turn self-checking with respect to its possible permanent, as well as temporary, internal, realistic faults.

Index Terms:

Concurrent checking, clock signals, temporary faults, self-checking circuits

Citation:

Cecilia Metra, Michele Favalli, Bruno Riccò, "Concurrent Checking of Clock Signal Correctness," IEEE Design and Test of Computers, vol. 15, no. 4, pp. 42-48, Oct.-Dec. 1998, doi:10.1109/54.735926

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