Sergio Lopez-Buedo, Javier Garrido, Eduardo Boemo,
"Thermal Testing on Reconfigurable Computers,"
IEEE Design and Test of Computers, vol. 17, no. 1, pp. 84-91, January-March, 2000.
BibTex
x
@article{
10.1109/54.825679, author = {Sergio Lopez-Buedo and Javier Garrido and Eduardo Boemo}, title = {Thermal Testing on Reconfigurable Computers}, journal ={IEEE Design and Test of Computers}, volume = {17}, number = {1}, issn = {0740-7475}, year = {2000}, pages = {84-91}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.825679}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - MGZN JO - IEEE Design and Test of Computers TI - Thermal Testing on Reconfigurable Computers IS - 1 SN - 0740-7475 SP84 EP91 EPD - 84-91 A1 - Sergio Lopez-Buedo, A1 - Javier Garrido, A1 - Eduardo Boemo, PY - 2000 VL - 17 JA - IEEE Design and Test of Computers ER -
Ring-oscillators are useful to monitor the thermal status of reconfigurable computers. No analog parts exist, and the sensors can be dynamically inserted, moved, or eliminated.
Citation:
Sergio Lopez-Buedo, Javier Garrido, Eduardo Boemo, "Thermal Testing on Reconfigurable Computers," IEEE Design and Test of Computers, vol. 17, no. 1, pp. 84-91, Jan.-Mar. 2000, doi:10.1109/54.825679
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