Rohit Kapur, Cy Hay, T.w. Williams,
"The Mutating Metric for Benchmarking Test,"
IEEE Design and Test of Computers, vol. 17, no. 3, pp. 18-21, July-September, 2000.
BibTex
x
@article{
10.1109/54.867890, author = {Rohit Kapur and Cy Hay and T.w. Williams}, title = {The Mutating Metric for Benchmarking Test}, journal ={IEEE Design and Test of Computers}, volume = {17}, number = {3}, issn = {0740-7475}, year = {2000}, pages = {18-21}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.867890}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - MGZN JO - IEEE Design and Test of Computers TI - The Mutating Metric for Benchmarking Test IS - 3 SN - 0740-7475 SP18 EP21 EPD - 18-21 A1 - Rohit Kapur, A1 - Cy Hay, A1 - T.w. Williams, PY - 2000 VL - 17 JA - IEEE Design and Test of Computers ER -
The monitoring of three ATPG tool parameters—fault coverage, test generation time, and test vector count—has improved test benchmarking over the years. Changing test dynamics, however, requires a different test metric.
Citation:
Rohit Kapur, Cy Hay, T.w. Williams, "The Mutating Metric for Benchmarking Test," IEEE Design and Test of Computers, vol. 17, no. 3, pp. 18-21, July-Sept. 2000, doi:10.1109/54.867890
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