Defect-Oriented Testing and Defective-Part-Level Prediction

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http://doi.ieeecomputersociety.org/10.1109/54.902820

January/February 2001 (vol. 18 no. 1) pp. 31-41

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	Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang, "Defect-Oriented Testing and Defective-Part-Level Prediction," IEEE Design and Test of Computers, vol. 18, no. 1, pp. 31-41, January/February, 2001.

	BibTex	x
	@article{ 10.1109/54.902820, author = {Jennifer Dworak and Jason D. Wicker and Sooryong Lee and Michael R. Grimaila and M. Ray Mercer and Kenneth M. Butler and Bret Stewart and Li-C. Wang}, title = {Defect-Oriented Testing and Defective-Part-Level Prediction}, journal ={IEEE Design and Test of Computers}, volume = {18}, number = {1}, issn = {0740-7475}, year = {2001}, pages = {31-41}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.902820}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Defect-Oriented Testing and Defective-Part-Level Prediction IS - 1 SN - 0740-7475 SP31 EP41 EPD - 31-41 A1 - Jennifer Dworak, A1 - Jason D. Wicker, A1 - Sooryong Lee, A1 - Michael R. Grimaila, A1 - M. Ray Mercer, A1 - Kenneth M. Butler, A1 - Bret Stewart, A1 - Li-C. Wang, PY - 2001 VL - 18 JA - IEEE Design and Test of Computers ER -

A defective-part-level model combined with a method for choosing test patterns that use site observation can predict defect levels in submicron ICs more accurately than simple stuck-at fault analysis.

Citation:

Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang, "Defect-Oriented Testing and Defective-Part-Level Prediction," IEEE Design and Test of Computers, vol. 18, no. 1, pp. 31-41, Jan./Feb. 2001, doi:10.1109/54.902820

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