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Modeling the Economics of Testing: A DFT Perspective
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.980051January/February 2002 (vol. 19 no. 1) pp. 29-41
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Pranab K. Nag, Anne Gattiker, Sichao Wei, R.D. Blanton, Wojciech Maly, "Modeling the Economics of Testing: A DFT Perspective," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 29-41, January/February, 2002.
 
 
BibTex
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@article{ 10.1109/54.980051,
author = {Pranab K. Nag and Anne Gattiker and Sichao Wei and R.D. Blanton and Wojciech Maly},
title = {Modeling the Economics of Testing: A DFT Perspective},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {1},
issn = {0740-7475},
year = {2002},
pages = {29-41},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.980051},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Modeling the Economics of Testing: A DFT Perspective
IS - 1
SN - 0740-7475
SP29
EP41
EPD - 29-41
A1 - Pranab K. Nag,
A1 - Anne Gattiker,
A1 - Sichao Wei,
A1 - R.D. Blanton,
A1 - Wojciech Maly,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

Deciding whether and how to use DFT is difficult because the relationship of costs and benefits is far from being well understood. The tradeoff-modeling procedure presented here helps users fill in the missing links in the DFT decision-making process.

Citation:
Pranab K. Nag, Anne Gattiker, Sichao Wei, R.D. Blanton, Wojciech Maly, "Modeling the Economics of Testing: A DFT Perspective," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 29-41, Jan./Feb. 2002, doi:10.1109/54.980051
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