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Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/54.980052January/February 2002 (vol. 19 no. 1) pp. 42-53
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Ismet Bayraktaroglu, Alex Orailoglu, "Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 42-53, January/February, 2002.
 
 
BibTex
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@article{ 10.1109/54.980052,
author = {Ismet Bayraktaroglu and Alex Orailoglu},
title = {Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {1},
issn = {0740-7475},
year = {2002},
pages = {42-53},
doi = {http://doi.ieeecomputersociety.org/10.1109/54.980052},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - MGZN
JO - IEEE Design and Test of Computers
TI - Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST
IS - 1
SN - 0740-7475
SP42
EP53
EPD - 42-53
A1 - Ismet Bayraktaroglu,
A1 - Alex Orailoglu,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

Identifying fault-embedding scan cells is a significant challenge for fault diagnosis in scan-based BIST. Deterministic partitioning techniques provide cost-effective solutions to this problem. Both mathematical solutions and simulations on hardware implementations demonstrate the effectiveness of these techniques.

Citation:
Ismet Bayraktaroglu, Alex Orailoglu, "Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST," IEEE Design and Test of Computers, vol. 19, no. 1, pp. 42-53, Jan./Feb. 2002, doi:10.1109/54.980052
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