Online Testing Approach for Very Deep-Submicron ICs

DOI Bookmark:

http://doi.ieeecomputersociety.org/10.1109/54.990438

March/April 2002 (vol. 19 no. 2) pp. 16-23

	This Article
	PURCHASE ARTICLE: $19 PDF HTML IEEE Xplore Subscribers
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Michele Favalli Articles by Cecilia Metra

	ASCII Text	x
	Michele Favalli, Cecilia Metra, "Online Testing Approach for Very Deep-Submicron ICs," IEEE Design and Test of Computers, vol. 19, no. 2, pp. 16-23, March/April, 2002.

	BibTex	x
	@article{ 10.1109/54.990438, author = {Michele Favalli and Cecilia Metra}, title = {Online Testing Approach for Very Deep-Submicron ICs}, journal ={IEEE Design and Test of Computers}, volume = {19}, number = {2}, issn = {0740-7475}, year = {2002}, pages = {16-23}, doi = {http://doi.ieeecomputersociety.org/10.1109/54.990438}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Online Testing Approach for Very Deep-Submicron ICs IS - 2 SN - 0740-7475 SP16 EP23 EPD - 16-23 A1 - Michele Favalli, A1 - Cecilia Metra, PY - 2002 VL - 19 JA - IEEE Design and Test of Computers ER -

Michele Favalli

Cecilia Metra

Very deep-submicron technologies pose new challenges to IC testing. In particular, crosstalk and transient faults are difficult to detect with traditional methods. Online testing techniques can detect these faults, however, and a new approach extends these techniques to include gross-delay faults. Moreover, this approach can be exploited to detect stuck-at and bridging faults offline.

Citation:

Michele Favalli, Cecilia Metra, "Online Testing Approach for Very Deep-Submicron ICs," IEEE Design and Test of Computers, vol. 19, no. 2, pp. 16-23, Mar./Apr. 2002, doi:10.1109/54.990438

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.