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The Return of Silicon Efficiency
Montpellier, France June 25-June 27
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ARITH.2007.3618th IEEE Symposium on Computer Arith ...
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Simon Knowles, "The Return of Silicon Efficiency," Computer Arithmetic, IEEE Symposium on, pp. 3, 18th IEEE Symposium on Computer Arithmetic (ARITH '07), 2007.
 
 
BibTex
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@article{ 10.1109/ARITH.2007.36,
author = {Simon Knowles},
title = {The Return of Silicon Efficiency},
journal ={Computer Arithmetic, IEEE Symposium on},
volume = {0},
year = {2007},
issn = {1063-6889},
pages = {3},
doi = {http://doi.ieeecomputersociety.org/10.1109/ARITH.2007.36},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Computer Arithmetic, IEEE Symposium on
TI - The Return of Silicon Efficiency
SN - 1063-6889
SP
EP
A1 - Simon Knowles,
PY - 2007
KW - null
VL - 0
JA - Computer Arithmetic, IEEE Symposium on
ER -
 
The economic and physical forces which have always shaped the business of digital chip design are again evolving to change the priorities of designers. Key physical trends include the end of gate oxide thickness scaling, and the effect of small dopant populations on threshold voltage variance. Key economic trends include the need to tolerate specification shift and design error, and the need to amortise chip development cost over multiple market sockets.
Citation:
Simon Knowles, "The Return of Silicon Efficiency," arith, pp.3, 18th IEEE Symposium on Computer Arithmetic (ARITH '07), 2007
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