In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our approach is a generic (parametrical) architectural template, Configurable Nanostructures for reliAble Nano electronics (CONAN(, which embeds support for reliability at various levels of abstractions. Some of the main reliability sources are regular and decentralized structures based on simple basic computation cells designed to be robust against disturbances and noise, fault tolerance based on hardware, time and information redundancy applied at the basic cell level as well as at higher levels, self diagnosis assisted by the dynamic reconfiguration of basic computation cells and interconnect rerouting. Within the CONAN template both technology dependent and independent models co-exists such that the more abstract layers are technology independent while the lower levels can be retargeted to various fabrication technologies. Our proposal is applicationoriented and allows the designers to deal with unpredictability, and low reliability, which are unavoidable characteristics of future emerging nano-devices. When combined with the underlying software, the tools supporting the CONAN approach allow the designer to check whether the design constraints are fulfilled before performing a detailed implementation and provides means to trade area, delay, and power consumptions for reliability. As such, this proposal is a call-to-arms to mobilize the efforts of systems designers in order to achieve a systematic design methodology for reliable systems.