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Runtime leakage power estimation technique for combinational circuits
Yokohama January 23-January 26
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ASPDAC.2007.3580622007 Asia and South Pacific Design Au ...
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null Yu-Shiang Lin, Electron. Eng.&Comput. Sci., Michigan Univ.
D. Sylvester, Electron. Eng.&Comput. Sci., Michigan Univ.
This paper carefully examines subthreshold leakage during circuit operation (runtime) and develops a novel analysis technique to capture this important effect, which is currently ignored in traditional steady-state leakage calculation approaches. We implement novel dynamic and static estimation methods that provide significant speed improvements over full SPICE simulations and yield estimation errors of approximately 12% on average compared to more than 2times errors in steady-state based subthreshold leakage analysis.
Index Terms:
subthreshold leakage analysis, runtime leakage power estimation technique, combinational circuits, dynamic estimation methods, static estimation methods, SPICE simulations, error estimation
Citation:
null Yu-Shiang Lin, D. Sylvester, "Runtime leakage power estimation technique for combinational circuits," asp-dac, pp.660-665, 2007 Asia and South Pacific Design Automation Conference, 2007
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