New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors

Calcutta, India December 18-December 21

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http://doi.ieeecomputersociety.org/10.1109/ATS.2005.80

14th Asian Test Symposium (ATS'05)

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	D. Marienfeld, E. S. Sogomonyan, V. Ocheretnij, M. Gossel, "New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors," Asian Test Symposium, pp. 76-81, 14th Asian Test Symposium (ATS'05), 2005.

	BibTex	x
	@article{ 10.1109/ATS.2005.80, author = {D. Marienfeld and E. S. Sogomonyan and V. Ocheretnij and M. Gossel}, title = {New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors}, journal ={Asian Test Symposium}, volume = {0}, year = {2005}, issn = {1081-7735}, pages = {76-81}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.80}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors SN - 1081-7735 SP76 EP81 A1 - D. Marienfeld, A1 - E. S. Sogomonyan, A1 - V. Ocheretnij, A1 - M. Gossel, PY - 2005 KW - null VL - 0 JA - Asian Test Symposium ER -

D. Marienfeld, University of Potsdam, Germany

E. S. Sogomonyan, University of Potsdam, Germany

V. Ocheretnij, University of Potsdam, Germany

M. Gossel, University of Potsdam, Germany

In this paper a new self-checking code-disjoint Booth-2 multiplier with an improved error detection and with a reduced area overhead is proposed. Compared to the 64?64 multiplier without error detection the area for the proposed multiplier increases for the different implementations only by 23%-30%. Especially for soft errors the error detection capability is significantly improved. All even or odd (soft) errors in the output registers are detected.

Citation:

D. Marienfeld, E. S. Sogomonyan, V. Ocheretnij, M. Gossel, "New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors," ats, pp.76-81, 14th Asian Test Symposium (ATS'05), 2005

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