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A Taxonomy for Physics Based Synthetic Biometric Models
Buffalo, New York October 17-October 18
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/AUTOID.2005.8Fourth IEEE Workshop on Automatic Ide ...
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Douglas J. Buettner, Nicholas M. Orlans, "A Taxonomy for Physics Based Synthetic Biometric Models," Automatic Identification Advanced Technologies, IEEE Workshop on, pp. 10-14, Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05), 2005.
 
 
BibTex
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@article{ 10.1109/AUTOID.2005.8,
author = {Douglas J. Buettner and Nicholas M. Orlans},
title = {A Taxonomy for Physics Based Synthetic Biometric Models},
journal ={Automatic Identification Advanced Technologies, IEEE Workshop on},
volume = {0},
year = {2005},
isbn = {0-7695-2475-3},
pages = {10-14},
doi = {http://doi.ieeecomputersociety.org/10.1109/AUTOID.2005.8},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Automatic Identification Advanced Technologies, IEEE Workshop on
TI - A Taxonomy for Physics Based Synthetic Biometric Models
SN - 0-7695-2475-3
SP10
EP14
A1 - Douglas J. Buettner,
A1 - Nicholas M. Orlans,
PY - 2005
KW - null
VL - 0
JA - Automatic Identification Advanced Technologies, IEEE Workshop on
ER -
 
Douglas J. Buettner, The Aerospace Corporation
Nicholas M. Orlans, The MITRE Corporation
Computer generated "synthetic" biometrics are not widely used within the biometrics community beyond their current use as a research tool. Yet they offer a number of potential advantages that can be developed further to support the science and practical use of biometrics. Physics-based and intermediate-pattern generation of biometrics will require validation of the underlying statistical distributions if they are to be used as more than just a research tool. This paper proposes a taxonomy for physics-based models to be used in the creation of synthetic biometrics.
Citation:
Douglas J. Buettner, Nicholas M. Orlans, "A Taxonomy for Physics Based Synthetic Biometric Models," autoid, pp.10-14, Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05), 2005
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