FO[\le]-Uniformity

Prague, Czech Republic July 16-July 20

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http://doi.ieeecomputersociety.org/10.1109/CCC.2006.20

21st Annual IEEE Conference on Compu ...

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	ASCII Text	x
	Christoph Behl, Klaus-Jorn Lange, "FO[\le]-Uniformity," Computational Complexity, Annual IEEE Conference on, pp. 183-189, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006.

	BibTex	x
	@article{ 10.1109/CCC.2006.20, author = {Christoph Behl and Klaus-Jorn Lange}, title = {FO[\le]-Uniformity}, journal ={Computational Complexity, Annual IEEE Conference on}, volume = {0}, year = {2006}, issn = {1093-0159}, pages = {183-189}, doi = {http://doi.ieeecomputersociety.org/10.1109/CCC.2006.20}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computational Complexity, Annual IEEE Conference on TI - FO[\le]-Uniformity SN - 1093-0159 SP183 EP189 A1 - Christoph Behl, A1 - Klaus-Jorn Lange, PY - 2006 KW - null VL - 0 JA - Computational Complexity, Annual IEEE Conference on ER -

Christoph Behl, Universitat Tubingen, Germany

Klaus-Jorn Lange, Universitat Tubingen, Germany

Uniformity notions more restrictive than the usual FO[\le,+, ]-uniformity = FO[\le,Bit]-uniformity are introduced. It is shown that the general framework exhibited by Barrington et al. still holds if the fan-in of the gates in the corresponding circuits is considered.

Citation:

Christoph Behl, Klaus-Jorn Lange, "FO[\le]-Uniformity," ccc, pp.183-189, 21st Annual IEEE Conference on Computational Complexity (CCC'06), 2006

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