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Towards a Formal Framework for Product Line Test Development
Aizu-Wakamatsu City, Fukushima, Japan October 16-October 19
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CIT.2007.407th IEEE International Conference on ...
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Sungwon Kang, Jihyun Lee, Myungchul Kim, Woojin Lee, "Towards a Formal Framework for Product Line Test Development," Computer and Information Technology, International Conference on, pp. 921-926, 7th IEEE International Conference on Computer and Information Technology (CIT 2007), 2007.
 
 
BibTex
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@article{ 10.1109/CIT.2007.40,
author = {Sungwon Kang and Jihyun Lee and Myungchul Kim and Woojin Lee},
title = {Towards a Formal Framework for Product Line Test Development},
journal ={Computer and Information Technology, International Conference on},
volume = {0},
year = {2007},
isbn = {0-7695-2983-6},
pages = {921-926},
doi = {http://doi.ieeecomputersociety.org/10.1109/CIT.2007.40},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Computer and Information Technology, International Conference on
TI - Towards a Formal Framework for Product Line Test Development
SN - 0-7695-2983-6
SP921
EP926
A1 - Sungwon Kang,
A1 - Jihyun Lee,
A1 - Myungchul Kim,
A1 - Woojin Lee,
PY - 2007
VL - 0
JA - Computer and Information Technology, International Conference on
ER -
 
Sungwon Kang, Information and Communications University, Korea
Jihyun Lee, Information and Communications University, Korea
Myungchul Kim, Information and Communications University, Korea
Woojin Lee, Information and Communications University, Korea
Product line test development is more complicated than the conventional test development for a single application. There were numerous research works in the past that address various issues and aspects that arise in product line testing and test development. However, we still lack a coherent framework that can guide product line test development and link various product line development concepts to relevant product line testing concepts. In this paper we provide a basis for a formal framework for product line test development by linking product line development concepts such as feature, variability, product line architecture, component and use case scenario to product line test concepts such as test architecture, variability for test and test scenario and by providing a systematic way for deriving product line tests, adapting product line tests to a specific product and deriving product specific tests.
Citation:
Sungwon Kang, Jihyun Lee, Myungchul Kim, Woojin Lee, "Towards a Formal Framework for Product Line Test Development," cit, pp.921-926, 7th IEEE International Conference on Computer and Information Technology (CIT 2007), 2007
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