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A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model
Edinburgh, Scotland July 26-July 28
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2005.1929th Annual International Computer So ...
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Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu, "A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model," Computer Software and Applications Conference, Annual International, vol. 1, pp. 41-46, 29th Annual International Computer Software and Applications Conference (COMPSAC'05) Volume 1, 2005.
 
 
BibTex
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@article{ 10.1109/COMPSAC.2005.19,
author = {Ching-Pao Chang and Jia-Lyn Lv and Chih-Ping Chu},
title = {A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model},
journal ={Computer Software and Applications Conference, Annual International},
volume = {1},
year = {2005},
issn = {0730-3157},
pages = {41-46},
doi = {http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2005.19},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Computer Software and Applications Conference, Annual International
TI - A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model
SN - 0730-3157
SP41
EP46
A1 - Ching-Pao Chang,
A1 - Jia-Lyn Lv,
A1 - Chih-Ping Chu,
PY - 2005
KW - inspection
KW - capture-recapture model
KW - defect estimation
KW - and re-inspection model
VL - 1
JA - Computer Software and Applications Conference, Annual International
ER -
 
Defect prediction is an important process in the evaluation of software quality. To accurately predict the rate of software defects can not only facilitate software review decisions, but can also improve software quality. In this paper, we have provided a defect estimation approach, which uses defective data from sequential inspections to increase the accuracy of estimating defects. To demonstrate potential improvements, the results of our approach were compared to those of two other popular estimation approaches, the Capture-Recapture model and the Reiinspection model. By using the proposed approach, software organizations may increase the accuracy of their defect predictions and reduce the effort of subsequent inspections.
Index Terms:
inspection, capture-recapture model, defect estimation, and re-inspection model
Citation:
Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu, "A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model," compsac, vol. 1, pp.41-46, 29th Annual International Computer Software and Applications Conference (COMPSAC'05) Volume 1, 2005
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