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Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
Munich, Germany March 07-March 11
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2005.233Design, Automation and Test in Europe ...
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R. Kheriji, V. Danelon, J. L. Carbonero, S. Mir, "Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 170-171, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005.
 
 
BibTex
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@article{ 10.1109/DATE.2005.233,
author = {R. Kheriji and V. Danelon and J. L. Carbonero and S. Mir},
title = {Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2005},
issn = {1530-1591},
pages = {170-171},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.233},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
SN - 1530-1591
SP170
EP171
A1 - R. Kheriji,
A1 - V. Danelon,
A1 - J. L. Carbonero,
A1 - S. Mir,
PY - 2005
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
R. Kheriji, ST Microelectronics, France; TIMA laboratory, France
V. Danelon, ST Microelectronics, France
J. L. Carbonero, ST Microelectronics, France
S. Mir, TIMA laboratory, France
This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.
Citation:
R. Kheriji, V. Danelon, J. L. Carbonero, S. Mir, "Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach," date, vol. 1, pp.170-171, Design, Automation and Test in Europe (DATE'05) Volume 1, 2005
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