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Design of High-Speed Metal-Semiconductor-Metal Photodetectors: An Optimization-Based Approach
Kuala Lumpur, Malaysia January 17-January 19
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.33Third IEEE International Workshop on ...
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Kan-Lin Hsiung, "Design of High-Speed Metal-Semiconductor-Metal Photodetectors: An Optimization-Based Approach," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 83-84, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006.
 
 
BibTex
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@article{ 10.1109/DELTA.2006.33,
author = {Kan-Lin Hsiung},
title = {Design of High-Speed Metal-Semiconductor-Metal Photodetectors: An Optimization-Based Approach},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2006},
isbn = {0-7695-2500-8},
pages = {83-84},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2006.33},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - Design of High-Speed Metal-Semiconductor-Metal Photodetectors: An Optimization-Based Approach
SN - 0-7695-2500-8
SP83
EP84
A1 - Kan-Lin Hsiung,
PY - 2006
KW - null
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Kan-Lin Hsiung, Stanford University
The finger sizing of interdigitated Schottky-barrier Metal-Semiconductor-Metal Photodetectors (MSM-PD) is discussed in this paper. We observe that an MSM-PD geometry with fast response speed can be determined by solving a special form of optimization problem called posynomial programming, for which very efficient global optimization methods have been developed. Our method, therefore, yields completely automated finger sizing of MSM-PD, directly from specifications.
Citation:
Kan-Lin Hsiung, "Design of High-Speed Metal-Semiconductor-Metal Photodetectors: An Optimization-Based Approach," delta, pp.83-84, Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06), 2006
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